Atomic force spectroscopy (AFM) is a versatile tool to investigate surfaces with nanoscale precision. The method utilizes the deflection of a cantilever in response to tip surface interactions, thereby  providing informations  such as height or elasticity on a given position. Repeated measurements while scanning  over defined areas can even provide maps of the parameter of interest. Using AFM we are able to determine the spatial distribution of mechanical  cell wall properties during morphogenesis. (Image modified from Goldenbogen et al., Open Biol (2016), CC BY 4.0 license.)